Test chain testability in a system for testing tri-state functionality
US8397112B2 · kind B2 · utility
0Cited by
4References
14Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 16, 2010 |
| Grant date | Mar 12, 2013 |
| Priority date | — |
| Expiry date | Sep 26, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31715
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An embodiment of the invention provides system for detecting faults on a test chain. A circuit provides a test signal to an input of a test chain. The test chain includes a plurality of buffers connected in series. A register receives a logical value representing the output of the test chain. The register sends the logical value representing the output of the test chain to test circuitry where the value is observed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.