Inventor · Richardson, TX, US

Alan Hales

25Patents
7h-index
13Co-inventors
62Inventor score

Filing activity: Nov 22, 2002 → Jul 9, 2021

Most-cited inventions

PatentTitleAreaCited byStatus
US6894308B2 IC with comparator receiving expected and mask data from pads Physics 35 Expired
US8205125B2 Enhanced control in scan tests of integrated circuits with partitioned scan chains Physics 30 Active
US7842949B2 IC with comparator receiving expected and mask data from pads Physics 10 Active
US7491970B2 IC with comparator receiving expected and mask data from pads Physics 9 Active
US7655946B2 IC with comparator receiving expected and mask data from pads Physics 8 Active
US8525565B2 Family of multiplexer/flip-flops with enhanced testability Electricity 8 Active
US8299464B2 Comparator receiving expected and mask data from circuit pads Physics 8 Active
US7469372B2 Scan sequenced power-on initialization Physics 6 Active
US8375265B1 Delay fault testing using distributed clock dividers Physics 5 Active
US7183570B2 IC with comparator receiving expected and mask data from pads Physics 4 Expired
US7039823B2 On-chip reset circuitry and method Physics 2 Expired
US8872178B2 IC with comparator receiving expected and mask data from pads Physics 1 Active
US10120025B2 Functional core circuitry with serial scan test expected, mask circuitry Physics 1 Active
US9562946B2 Integrated circuit wafer having plural dies with each die including test circuit receiving expected data and mask data from different pads Physics 1 Active
US9322879B2 Integrated circuit wafer having integrated circuit die with plural comparators receiving expected data and mask data from different pads Physics 1 Active
US9103885B2 Integrated circuit with plural comparators receiving expected data and mask data from different pads Physics 0 Active
US7389455B2 Register file initialization to prevent unknown outputs during test Physics 0 Active
US11092650B2 Re-programmable self-test Physics 0 Active
US8692248B2 Integrated circuit die having input and output circuit pads, test circuitry, and multiplex circuitry Physics 0 Active
US9702935B2 Packet based integrated circuit testing Physics 0 Active
US8397112B2 Test chain testability in a system for testing tri-state functionality Physics 0 Active
US8604475B2 IC dies with serarate connections to expected and mask data Physics 0 Active
US9829538B2 IC expected data and mask data on I/O data pads Physics 0 Active
US11768240B2 Re-programmable self-test Physics 0 Active
US10247780B2 Re-programmable self-test Physics 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.