Terahertz investigative system and method
US8399838B2 · kind B2 · utility
3Cited by
12References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 23, 2009 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Mar 11, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for investigating a plurality of samples having varying positions or orientations moving with respect to the system, the system including an emitter of terahertz radiation for irradiating a sample provided in a sample space; a detector of terahertz radiation configured to detect radiation reflected from said sample space; and determining means to determine if radiation reflected from said sample space is from a sample with a predetermined orientation in the sample space.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.