Tandem handler system and method for reduced index time
US8400180B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 20, 2009 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Aug 20, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for testing with an automated test equipment (ATE) includes a tester having at least one test resource, a tandem handler, and a mux relay that switchably connects the test resource, via parallel connections, to either one of dual sockets at each instant of testing. The handler has first and second manipulator arms. Each arm operates as to a particular one of the respective sockets, to retrieve a next device to be tested and position the device in the socket (while testing is performed on a device in the other socket), to disposition the device from the socket once testing is completed as to the device in the socket, and thereafter repeat until all staged devices for testing have been tested (or an interruption of testing otherwise occurs). The mux relay switches between sockets in response to the tandem handler acting as a master and the tester as slave. Upon completion of testing via the test resource as to an applicable pin of one socket, the test resource is switchably connected via the mux relay to a functionally same applicable pin of the other socket.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.