Reconfigurable testing system and method
US8402313B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 20, 2007 |
| Grant date | Mar 19, 2013 |
| Priority date | — |
| Expiry date | Mar 5, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/273
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One disclosed system and method enables dynamic reconfiguration of an electronic device in association with testing activities in a convenient and efficient manner. In one implementation, the electronic device includes a bus for communicating information, a microprocessor for processing data, a programmable functional component including a plurality of functional blocks programmable to provide a plurality of functions and configurations, and a memory for storing instructions including instructions for causing the programmable functional component to change functions and configurations. The components are programmably configurable to perform a variety of functions. In one example, the memory stores a plurality of configuration images that define the configuration and functionality of the circuit. The information stored in the memory facilitates dynamic reconfiguration of the circuit in accordance with the test harness instructions. Based upon a command from a test computer, the electronic device is automatically reconfigured by the test harness activating different configuration images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.