High frequency deflection measurement of IR absorption
US8402819B2 · kind B2 · utility
20Cited by
1References
11Claims
0Family size
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Key dates
| Filing date | Dec 5, 2008 |
| Grant date | Mar 26, 2013 |
| Priority date | — |
| Expiry date | Jun 2, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Significant issues as to size, cost of implementation, and repeatability/robustness of results exist in commercializing the technique. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.