Charged particle extraction device and method of design there for
US8405043B2 · kind B2 · utility
2Cited by
20References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2011 |
| Grant date | Mar 26, 2013 |
| Priority date | — |
| Expiry date | Mar 21, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/31749
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The present invention provides a method for extracting a charged particle beam from a charged particle source. A set of electrodes is provided at the output of the source. The potentials applied to the electrodes produce a low-emittance growth beam with substantially zero electric field at the output of the electrodes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.