Patent · US Active

Integrated circuit self-monitored burn-in

US8405412B2 · kind B2 · utility

3Cited by

1References

18Claims

0Family size

Assignee

LSI · US

Inventors

Ross A. Kohler · Allentown, US
Richard J. McPartland · Nazareth, US
Larry Wall · Evansville, US
Wayne E. Werner · Coopersburg, US

Key dates

Filing date	Apr 28, 2009
Grant date	Mar 26, 2013
Priority date	—
Expiry date	May 6, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG11C29/50
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An IC adapted for self-monitored burn-in includes a first memory and at least one BIST circuit coupled to the memory and operative to test the IC by executing a burn-in test and to generate test results indicative of at least one parameter of the burn-in test. The test results are at least temporarily stored in the first memory as a function of a first control signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.