Device and method for taking spectroscopic polarimetric measurements in the visible and near-infrared ranges
US8405830B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 28, 2009 |
| Grant date | Mar 26, 2013 |
| Priority date | — |
| Expiry date | May 12, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/213
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectroscopic polarimetric system of broad spectral range, includes a light source suitable for emitting an incident light beam over a wavelength range, a polarization state generator (PSG), a polarization state analyzer (PSA), and a detector. The PSG and the PSA have respective elements for modulating the polarization of the light beam. The elements of the PSG for modulating polarization are suitable for generating a sequence of m polarization states with m>4 at each measurement wavelength, the elements of the PSA for modulating polarization are suitable for determining a sequence of n polarization states with n>4 for each measurement wavelength, and the detector elements are suitable for acquiring a sequence of N measurements with 16<N≦n×m at each wavelength to extract therefrom a polarimetric spectroscopic measurement of the Mueller matrix of the sample. An extended spectroscopic polarimetric measurement method is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.