Patent · US Active

Method and apparatus for characterizing a sample with two or more optical traps

US8415613B2 · kind B2 · utility

24Cited by

3References

16Claims

0Family size

Assignee

JPK INSTRUMENTS AG · DE

Inventors

Sven-Peter Heyn · Berlin, DE
Jacob Kerssemakers · Amsterdam, NL
Detlef Knebel · Berlin, DE
Helge Eggert · Jena, DE
Torsten Jaehnke · Berlin, DE
Joern Kamps · Berlin, DE

Key dates

Filing date	May 30, 2008
Grant date	Apr 9, 2013
Priority date	—
Expiry date	May 30, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01Q60/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The present invention relates to a method for investigating a sample using scanning probe photon microscopy or optical force microscopy, and to an apparatus which is designed accordingly. The method or the apparatus provides for two optical traps which can be moved in a local region of the sample, wherein in at least one of the two traps a probe is held. The sample is scanned using the two traps and the measured data from the two traps are captured separately and evaluated by correlation. In particular interference signals resulting from an interaction between sample and light trap can be eliminated by the method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.