Patent · US Active

Bit scan circuits and method in non-volatile memory

US8427884B2 · kind B2 · utility

7Cited by
14References
20Claims
0Family size

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Key dates

Filing dateJun 20, 2011
Grant dateApr 23, 2013
Priority date
Expiry dateOct 18, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/44
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A circuit for counting in an N-bit string a number of bits M, having a first binary value includes N latch circuits in a daisy chain where each latch circuit has a tag bit that controls each to be either in a no-pass or pass state. Initially the tag bits are set according to the bits of the N-bit string where the first binary value corresponds to a no-pass state. A clock signal having a pulse train is run through the daisy chain to “interrogate” any no-pass latch circuits. It races right through any pass latch circuit. However, for a no-pass latch circuit, a leading pulse while being blocked also resets after a pulse period the tag bit from “no-pass” to “pass” state to allow subsequent pulses to pass. After all no-pass latch circuits have been reset, M is given by the number of missing pulses from the pulse train.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.