System and method of determining object pose
US8437535B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 19, 2007 |
| Grant date | May 7, 2013 |
| Priority date | — |
| Expiry date | May 17, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/875
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Briefly described, one embodiment determines pose of an object of interest at a run time by capturing a first image of a first structured light pattern projected onto a first local surface of the object of interest; determining a first run-time data set from the captured first image, wherein the first run-time data set corresponds to information determined from the first structured light pattern projected onto the first local surface; comparing the determined first run-time data set and a corresponding first reference data set, the first reference data set corresponding to an ideal pose of the first local surface on an ideally posed reference object; and determining at least one first degree of constraint that defines a first partial pose of the first local surface, the at least one first degree of constraint based upon the comparison of the first run-time data set with the corresponding first reference data set.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.