Nondestructive inspection method and system
US8442301B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2009 |
| Grant date | May 14, 2013 |
| Priority date | — |
| Expiry date | Jul 3, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system for nondestructively detecting and quantifying material anomalies within materials, including composite articles. The method entails performing a three-dimensional imaging scan technique, such as a computed tomography scan, of the material and a reference standard such that a test image of the material and a reference image of the reference standard appear in a plurality of two-dimensional scan views generated by the scan technique. The reference images are located in the scan views and normalized to determine at least an average value of the pixel data for the reference images. Values of pixel data of the test image are determined in each scan view, and then compared to the pixel data of the reference images to detect the presence of an anomaly in the test images. The detected anomaly in at least one of the test images of the scan views is then compared to a requirement standard for the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.