Patent · US Active

Single crystal silicon rod fabrication methods and a single crystal silicon rod structure

US8445332B2 · kind B2 · utility

1Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 19, 2007
Grant dateMay 21, 2013
Priority date
Expiry dateApr 16, 2029

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/2962
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of fabricating a single crystal silicon rod may include forming an insulation layer on a substrate, forming a hole in the insulation layer, selectively growing silicon in the hole, forming a silicon layer on the hole and on the insulation layer, forming a rod pattern on the silicon layer in a direction that is non-radial with respect to the hole, and melting the silicon layer and crystallizing the silicon layer by illuminating a laser beam on the silicon layer where the rod pattern is formed to generate a nucleation site at a position corresponding to the hole. According to the method, a single crystal silicon rod having no defects may be formed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.