Patent · US Active

Method for cleaning and passivating gallium arsenide surface autologous oxide and depositing AL203 dielectric

US8455372B2 · kind B2 · utility

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2Claims
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Key dates

Filing dateJun 20, 2012
Grant dateJun 4, 2013
Priority date
Expiry dateJun 20, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/306
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention belongs to the technical field of semiconductor materials and specifically relates to a method for cleaning and passivizing gallium arsenide (GaAs) surface autologous oxide and depositing an Al2O3 dielectric. This method includes: use a new-type of sulfur passivant to react with the autologous oxide on the GaAs surface to clean it and generate a passive sulfide film to separate the GaAs from the outside environment, thus preventing the GaAs from oxidizing again; further cleaning the residuals such as autologous oxides and sulfides on the GaAs surface through the pretreatment reaction of the reaction source trimethyl aluminum (TMA) of the Al2O3 ALD with the GaAs surface, and then deposit high-quality Al2O3 dielectric through ALD as the gate dielectric which fully separates the GaAs from the outside environment. The present invention features a simple process and good effects, and can provide preconditions for manufacturing the GaAs devices.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.