Method for compensating for variations in structures of an integrated circuit
US8458628B2 · kind B2 · utility
1Cited by
8References
22Claims
0Family size
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Key dates
| Filing date | Mar 6, 2012 |
| Grant date | Jun 4, 2013 |
| Priority date | — |
| Expiry date | Mar 6, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03F1/36
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of for compensating for variations in structures of an integrated circuit. The method includes (a) selecting a mask design shape and selecting a region of the mask design shape; (b) applying a model-based optical proximity correction to all of the mask design shape; and after (b), (c) applying a rules-based optical proximity correction to the selected region of the mask design shape.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.