Ion-sensitive sensor with multilayer construction in the sensitive region
US8461587B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 15, 2010 |
| Grant date | Jun 11, 2013 |
| Priority date | — |
| Expiry date | Mar 27, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/227
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An ion-sensitive sensor with an EIS structure includes: a semiconductor substrate, on which a layer of a substrate oxide 103 is produced; an adapting or matching layer, which is prepared on the substrate oxide; a chemically stable intermediate insulator, which is deposited on the adapting or matching layer; and a sensor layer, which comprises a tantalum oxide or a tantalum oxynitride, and which is applied on the intermediate insulator; wherein the intermediate insulator comprises hafnium oxide or zirconium oxide or a mixture of zirconium oxide and hafnium oxide, and wherein the adapting or matching layer differs in its chemical composition and/or in its structure from the intermediate insulator and from the substrate oxide.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.