Semiconductor device, method for controlling the same, and semiconductor system
US8462560B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 1, 2010 |
| Grant date | Jun 11, 2013 |
| Priority date | — |
| Expiry date | Mar 11, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2211/4067
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The semiconductor device includes a temperature sensor controlled so that temperature measurement is made once at each of a plurality of different reference temperatures at an interval of a preset number of times of refresh operations and a plurality of latch circuits holding the results of temperature measurement. A refresh period is set from outputs of the latch circuits inclusive of the result of temperature measurement carried out last time for each of a plurality of different reference temperatures. After start of measurement, temperature measurements are repeated every wait time corresponding to circulation of the refresh operations. The refresh period is set such that the high-temperature side results of temperature measurement are prioritized (FIG. 2).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.