Patent · US Active

Technology migration for integrated circuits with radical design restrictions

US8464189B2 · kind B2 · utility

5Cited by
31References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 18, 2010
Grant dateJun 11, 2013
Priority date
Expiry dateMay 9, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F30/39
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method, system and program product for migrating an integrated circuit (IC) design from a source technology without radical design restrictions (RDR) to a target technology with RDR, are disclosed. The invention implements a minimum layout perturbation approach that addresses the RDR requirements. The invention also solves the problem of inserting dummy shapes where required, and extending the lengths of the critical shapes and/or the dummy shapes to meet ‘edge coverage’ requirements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.