Patent · US Active

Loopback testing with phase alignment of a sampling clock at a test receiver apparatus

US8468398B2 · kind B2 · utility

3Cited by

1References

20Claims

0Family size

Assignee

Advanced Micro Devices, Inc. · US

Inventors

Kunlun Kenny Jiang · King City, CA
Nancy Chan · King City, CA

Key dates

Filing date	Jan 20, 2011
Grant date	Jun 18, 2013
Priority date	—
Expiry date	Dec 23, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31716
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

Methods and test receiver apparatus are provided for loopback testing of a unidirectional physical layer device. The disclosed methods and test receiver apparatus allow for the phase of a sampling clock implemented at the test receiver apparatus to be aligned with the phase of a test data signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.