Redundant memory to mask DRAM failures
US8473791B2 · kind B2 · utility
14Cited by
5References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2007 |
| Grant date | Jun 25, 2013 |
| Priority date | — |
| Expiry date | Mar 26, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/76
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method comprises detecting a defective area in a Dynamic Random Access Memory (DRAM). The method further comprises establishing a redundant memory buffer at a per-memory module level. The method still further comprises loading the redundant memory buffer with a copy of data from the defective area. The method additionally comprises substituting data from the redundant memory buffer for data stored in the defective area upon a memory access to the defective area.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.