Patent · US Active

Anisotropic strain control in semipolar nitride quantum wells by partially or fully relaxed aluminum indium gallium nitride layers with misfit dislocations

US8481991B2 · kind B2 · utility

4Cited by
0References
27Claims
0Family size

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Key dates

Filing dateAug 23, 2010
Grant dateJul 9, 2013
Priority date
Expiry dateNov 5, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10H20/825
  • WIPO fieldOptics
  • WIPO sectorInstruments

Abstract

An epitaxial structure for a III-Nitride based optical device, comprising an active layer with anisotropic strain on an underlying layer, where a lattice constant and strain in the underlying layer are partially or fully relaxed in at least one direction due to a presence of misfit dislocations, so that the anisotropic strain in the active layer is modulated by the underlying layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.