Disposition of integrated circuits using performance sort ring oscillator and performance path testing

US8490040B2 · kind B2 · utility

Assignee

• International Business Machines Corporation · US

Inventors

• Jeanne P. Bickford · South Burlington, US
• Peter A. Habitz · South Burlington, US
• Vikram Iyengar · South Burlington, US
• David E. Lackey · Jericho, US
• Jinjun Xiong · Yorktown Heights, US

Key dates

• Filing date: Nov 11, 2011
• Grant date: Jul 16, 2013
• Expiry date: Nov 11, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/31725
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and system for dispositioning integrated circuit chips. The method includes performing a performance path test on an integrated circuit chip having one or more clock domains, the performance path test based on applying test patterns to selected sensitizable data paths of the integrated circuit chip at different clock frequencies; and dispositioning the integrated circuit chip based on results of the performance path test.