Inventor · South Burlington, VT, US

Vikram Iyengar

26Patents
6h-index
30Co-inventors
65Inventor score

Filing activity: Feb 28, 2006 → Apr 3, 2018

Most-cited inventions

PatentTitleAreaCited byStatus
US7620921B2 IC chip at-functional-speed testing with process coverage evaluation Physics 23 Active
US9104834B2 Systems and methods for single cell product path delay analysis Physics 20 Active
US8543966B2 Test path selection and test program generation for performance testing integrated circuit chips Physics 8 Active
US8209141B2 System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count Physics 7 Active
US7996807B2 Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and method Physics 7 Active
US7856607B2 System and method for generating at-speed structural tests to improve process and environmental parameter space coverage Physics 7 Active
US9058034B2 Integrated circuit product yield optimization using the results of performance path testing Emerging Cross-Sectional Technologies 5 Active
US7721170B2 Apparatus and method for selectively implementing launch off scan capability in at speed testing Physics 5 Active
US8230283B2 Method to test hold path faults using functional clocking Physics 5 Active
US10424821B2 Thermally regulated modular energy storage device and methods Emerging Cross-Sectional Technologies 4 Active
US7779375B2 Design structure for shutting off data capture across asynchronous clock domains during at-speed testing Physics 3 Active
US7441171B2 Efficient scan chain insertion using broadcast scan for reduced bit collisions Physics 3 Active
US7685542B2 Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing Physics 3 Active
US7529294B2 Testing of multiple asynchronous logic domains Physics 2 Active
US8539429B1 System yield optimization using the results of integrated circuit chip performance path testing Physics 2 Active
US9557378B2 Method and structure for multi-core chip product test and selective voltage binning disposition Physics 2 Active
US8538718B2 Clock edge grouping for at-speed test Physics 2 Active
US8490040B2 Disposition of integrated circuits using performance sort ring oscillator and performance path testing Physics 2 Active
US8825433B2 Automatic generation of valid at-speed structural test (ASST) test groups Physics 1 Active
US8176362B2 Online multiprocessor system reliability defect testing Physics 1 Active
US8181135B2 Hold transition fault model and test generation method Physics 0 Active
US7793176B2 Method of increasing path coverage in transition test generation Physics 0 Active
US9043180B2 Reducing power consumption during manufacturing test of an integrated circuit Physics 0 Active
US8904329B2 Systems and methods for single cell product path delay analysis Physics 0 Active
US8996282B2 Fueling systems, methods and apparatus for an internal combustion engine Emerging Cross-Sectional Technologies 0 Active

Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.