Mass analysis device with wide angular acceptance including a reflectron
US8502139B2 · kind B2 · utility
3Cited by
5References
14Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 12, 2010 |
| Grant date | Aug 6, 2013 |
| Priority date | — |
| Expiry date | Aug 3, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/0004
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A mass analysis device with wide angular acceptance, notably of the mass spectrometer or atom probe microscope type, includes means for receiving a sample, means for extracting ions from the surface of the sample, and a reflectron producing a torroidal electrostatic field whose equipotential lines are defined by a first curvature in a first direction and a first center of curvature, and a second curvature in a second direction perpendicular to the first direction and a second center of curvature, the sample being positioned close to the first center of curvature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.