Patent · US Active

Microbolometer detector layer

US8502147B2 · kind B2 · utility

1Cited by

9References

23Claims

0Family size

Assignee

FLIR Systems, Inc. · US

Inventors

Yaroslava Petraitis · Ventura, US
Richard E. Bornfreund · Lompoc, US
Joseph H. Durham · Lompoc, US
Robert F. Cannata · Lompoc, US

Key dates

Filing date	Oct 4, 2011
Grant date	Aug 6, 2013
Priority date	—
Expiry date	Oct 27, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01J5/20
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A microbolometer is disclosed, including a bottom dielectric of a bridge structure; a detector layer disposed above the bottom dielectric, the detector layer comprised of a metal-doped vanadium pentaoxide material; and a top dielectric disposed above the detector layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.