Device for receiving a test sample

US8506909B2 · kind B2 · utility

Assignee

• JPK INSTRUMENTS AG · DE

Inventors

• Olaf Sünwoldt · Berlin, DE
• Detlef Knebel · Berlin, DE

Key dates

• Filing date: Aug 4, 2005
• Grant date: Aug 13, 2013
• Expiry date: Aug 4, 2025

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/0332
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a device for receiving a test sample, particularly sample holders for combined examination of the test sample by a test procedure combined with another test procedure, which differs from the first test procedure, with a planar preparation component (1) in a transparent material with a preparation surface on which the test sample can be prepared, wherein a test path for the introduction of a test facility for carrying out the test procedure is formed on one side of the preparation component (1) and another test path for the introduction of a test facility for carrying out the other test procedure on the test sample is formed on an opposite side of the preparation component (1), wherein a supporting and covering element (3a) which has an aperture (5) through which the test path is formed is pressed against the preparation component (1) on one side (FIG. 1).