Power dissipation test method and device therefor
US8516305B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2010 |
| Grant date | Aug 20, 2013 |
| Priority date | — |
| Expiry date | Sep 3, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Dynamic power test slave (DPTS) modules are placed at selected locations of a data processing device to provide data to a logic module of the device at a high rate during testing of the device. The DPTS module intercepts data requests targeted to another logic module and the DPTS instead provides the requested data, thus simulating data transfer by the target logic module. The simulated data transfers can provide for transitions at the data processing device from a relatively high power state to a relatively low power state. Accordingly, the DPTS modules allow for simulation of expected normal operating conditions during testing of the data processing device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.