Method for calibrating a measuring system
US8520067B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 8, 2006 |
| Grant date | Aug 27, 2013 |
| Priority date | — |
| Expiry date | Dec 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30244
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for calibrating a measuring system uses at least one camera for determining the position of an object in a reference three-dimensional coordinate system. The external and internal parameters of the camera are calibrated in various steps and the position of the camera is determined with the aid of external measuring means in accordance with three steps. In the first step, the internal camera parameters are ascertained and fixedly assigned to the internal camera. In a second step, the position of the internal camera in the measuring system is determined. In a third step, the orientation of the internal camera is ascertained in the reference three-dimensional coordinate system by evaluating camera images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.