Prioritized detection of memory corruption
US8522091B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 18, 2011 |
| Grant date | Aug 27, 2013 |
| Priority date | — |
| Expiry date | Nov 18, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/27
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment, a method of detecting corruption of configuration memory is provided. A bitstream of a circuit design that includes at least a first module and a second module is generated. Configuration memory cells used to implement each of the first and second modules are determined. The configuration memory cells are programmed with the bitstream. After programming, configuration memory cells used to implement the first module are checked for corruption at a first frequency, and configuration memory cells used to implement the second module are checked for corruption at a second frequency, with the first frequency being different from the second frequency.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.