Patent · US Active

Vacuum wafer level packaging method for micro electro mechanical system device

US8524571B2 · kind B2 · utility

0Cited by
6References
8Claims
0Family size

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Key dates

Filing dateDec 2, 2011
Grant dateSep 3, 2013
Priority date
Expiry dateMar 11, 2032

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/1461
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed is a vacuum wafer level packaging method for a micro electro mechanical system device, including: forming a plurality of via holes on an upper wafer for protecting a micro electro mechanical system (MEMS) wafer; forming at least one metal layer on inner walls of the plurality of via holes and regions extended from the plurality of via holes; arranging and bonding the upper wafer and the MEMS wafer at atmospheric pressure; applying solder paste to the regions extended from the plurality of via holes; filling a solder in the plurality of via holes by increasing the temperature of a high-vacuum chamber to melt the solder paste; and changing the solder in the plurality of via holes to a solid state by lowering the temperature of the high-vacuum chamber.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.