Selectable threshold reset circuit
US8531194B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Mar 24, 2011 |
| Grant date | Sep 10, 2013 |
| Priority date | — |
| Expiry date | Mar 15, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A low voltage testing circuit (125), system (100 and 200), and method for performing low-voltage testing of a circuit (127) in an integrated circuit package (104 and 204) include a selectable threshold reset circuit (125) that includes a voltage-divider ladder (320) that produces a voltage that is a fraction of a power supply voltage, a comparator (310) that compares the fraction with a reference voltage, a switch (350) that controls topology of the voltage-divider ladder thereby changing a value of the fraction, the switch controlled by a signal from a production tester (102 and 202), the signal causing a reset threshold of the selectable threshold reset circuit to be reduced below a normal reset threshold to allow testing of the circuit at a power supply voltage below the normal reset threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.