Particle image analysis method and apparatus
US8538119B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 12, 2009 |
| Grant date | Sep 17, 2013 |
| Priority date | — |
| Expiry date | Aug 5, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N15/1409
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A particle image analyzing method is adapted so that while raising image-reviewing efficiency at a cropped image level of particle components in a sample, the entire sample can be observed without significantly changing a related apparatus configuration. Prior to image reviewing of an imaging region, cropped images thereof are reviewed and, with reference to the images arranged for each kind of particle component, if the operator judges any particles to have been falsely identified, the operator uses an operating unit to modify positions of the particles to those of correct component items. An overall image of the imaging region is displayed and if any components to be added (overlooked components) appear, the kinds of these components are identified and quantitative data on each kind of component is registered. Upon completion of the registration, the concentration of the sample is recalculated and a comment is entered in a comment field.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.