Patent · US Active

Methods and systems for measuring I/O signals

US8539278B2 · kind B2 · utility

1Cited by

4References

22Claims

0Family size

Assignee

Infineon Technologies AG · DE

Inventors

Simon Brewerton · Trowbridge, GB
Patrick Leteinturier · Riemerling, DE
Oreste Bernardi · Mascalucia, IT
Antonio Vilela · Mering, DE
Klaus Scheibert · Grasbrunn, DE
Jens Barrenscheen · Munich, DE

Key dates

Filing date	Oct 29, 2010
Grant date	Sep 17, 2013
Priority date	—
Expiry date	Sep 22, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/3068
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

Some embodiments of the invention relate to an embedded processing system. The system includes a memory unit to store a plurality of operating instructions and a processing unit coupled to the memory unit. The processing unit can execute logical operations corresponding to respective operating instructions. An input/output (I/O) interface receives a first time-varying waveform and provides an I/O signal that is based on the first time-varying waveform. A comparison unit coupled to the processing unit and adapted to selectively assert an error signal based on whether the I/O signal has a predetermined relationship with a reference signal, wherein the predetermined relationship holds true during normal operation but fails to hold true when an unexpected event occurs and causes an unexpected change at least one of the I/O signal and reference signal.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.