Semiconductor memory device and thermal code output circuit capable of correctly measuring thermal codes
US8542548B2 · kind B2 · utility
1Cited by
1References
23Claims
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Key dates
| Filing date | Aug 15, 2008 |
| Grant date | Sep 24, 2013 |
| Priority date | — |
| Expiry date | Nov 21, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A thermal code output circuit is provided, comprising a pulse signal generator configured to receive multiple period signals and generate a pulse signal in response to a test mode signal, a thermal code output unit configured to output multiple thermal codes in response to the pulse signal, and a strobing signal output unit configured to output the pulse signal or a reference voltage selectively as a strobing signal in response to the test mode signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.