Method and apparatus for using an area X-ray detector as a point detector in an X-ray diffractometer
US8548123B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 29, 2010 |
| Grant date | Oct 1, 2013 |
| Priority date | — |
| Expiry date | Jun 30, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/207
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An area detector used in a two-dimensional system is used as a point detector in Bragg-Brentano and other geometries by providing the area detector with a mask the limits the area through which X-rays can enter the detector. Secondary X-ray optics and a monochromator that are part of the diffractometer geometry are attached to the area detector mask to allow a fast and easy switch between the two-dimensional detector mode and the point detector mode. A concave detector mask is used with a spherical detector in order to reduce the secondary beam path and increase detector efficiency and the opening in the detector mask can be offset from the mask center to achieve high 2θ angle measurements. Single channel bypath electronics are used to disregard the dimensional position of each X-ray count to increase the efficiency and speed of the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.