Patent · US Active

Micromechanical component and corresponding production method

US8558327B2 · kind B2 · utility

4Cited by
1References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 29, 2008
Grant dateOct 15, 2013
Priority date
Expiry dateJul 8, 2030

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB81B2203/0127
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A micromechanical component having a conductive substrate, a first conductive layer provided above the substrate and that forms, above a cavity provided in the substrate, an elastically deflectable diaphragm region of monocrystalline silicon and an adjacent peripheral region, a circuit trace level provided above the first conductive layer in a manner that is electrically insulated from the first conductive layer, the circuit trace level having above the diaphragm region a first electrode region and having above the peripheral region a first connection region electrically connected to the same, and a second conductive layer that is provided above the circuit trace level, the second conductive layer having above the diaphragm region a second electrode region that is electrically insulated from the first electrode region, and having above the peripheral region a second connection region electrically insulated from the second electrode region and electrically connected to the first connection region. Also provided is a suitable production method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.