Electrically conductive Kelvin contacts for microcircuit tester

US8558554B2 · kind B2 · utility

Assignee

• Johnstech International Corporation · US

Inventors

• Joel N. Erdman · Waconia, US
• Jeffrey C. Sherry · Savage, US
• Gary W. Michalko · Ham Lake, US

Key dates

• Filing date: Apr 21, 2010
• Grant date: Oct 15, 2013
• Expiry date: Dec 5, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R1/07378
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a “force” contact and a “sense” contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.