Patent · US Active

Method for generating hollow cathode plasma and method for treating large area substrate using hollow cathode plasma

US8574445B2 · kind B2 · utility

8Cited by
14References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 5, 2009
Grant dateNov 5, 2013
Priority date
Expiry dateMay 3, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/32596
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Provided are a method for generating hollow cathode plasma and a method for treating a large area substrate using the hollow cathode plasma. In the methods, the hollow cathode plasma is generated by a gas introduced between a hollow cathode in which a plurality of lower grooves where plasma is generated is defined in a bottom surface thereof and a baffle in which a plurality of injection holes is defined. A substrate disposed on a substrate support member is treated using the hollow cathode plasma passing through the injection holes. The uniform plasma having high density can be generated by hollow cathode effect due to the hollow cathode having the lower grooves and the injection holes of the baffle. Also, since the substrate can be treated using a hydrogen gas and a nitrogen gas in an ashing process, a damage of a low dielectric constant dielectric can be minimized.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.