Method for testing multiple coupons
US8575951B2 · kind B2 · utility
0Cited by
2References
6Claims
0Family size
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Key dates
| Filing date | May 20, 2011 |
| Grant date | Nov 5, 2013 |
| Priority date | — |
| Expiry date | Jul 5, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2893
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for testing multiple coupons is described. The x, y, and theta offset coordinates of a reference structure for each coupon are determined. Additionally, the x and y offset coordinates between the reference structure and the first test device are determined. After the reference data from all of the coupons have been determined, the testing sequence for all of the coupons can be initiated and completed without further intervention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.