Method and system for evaluating contact elements
US8577123B2 · kind B2 · utility
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22Claims
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Key dates
| Filing date | Jan 27, 2008 |
| Grant date | Nov 5, 2013 |
| Priority date | — |
| Expiry date | Sep 15, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30152
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method, system and a computer program product for evaluating contact elements, the method includes: acquiring images of multiple groups of contact elements, wherein each group of contact element was expected to be contacted during a test by the same group of probes so as to form multiple probe marks; and evaluating at least one characteristic of a first contact element in response to a comparison between a number of potential probe marks that appear in the image of a first contact element and a number of potential probe marks that appear in an image of a second contact element.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.