CAMTEK Ltd.
69Patents
66Active
69Granted
54Portfolio score
Filing activity: Mar 17, 2003 → Apr 24, 2024 · 16 expiring within 5 years
Most-cited patents
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US6934019B2 | Confocal wafer-inspection system | Physics | 15 | Expired |
| US8534787B2 | Method and system for printing on a printed circuit board | Electricity | 11 | Active |
| US8690135B2 | Chuck and a method for supporting an object | Electricity | 7 | Active |
| US9661755B2 | System and a method for solder mask inspection | Electricity | 6 | Active |
| US8319978B2 | System and method for probe mark analysis | Physics | 4 | Active |
| US8836780B2 | Process control and manufacturing method for fan out wafers | Electricity | 4 | Active |
| US9756313B2 | High throughput and low cost height triangulation system and method | Physics | 4 | Active |
| US9418413B1 | System and a method for automatic recipe validation and selection | Emerging Cross-Sectional Technologies | 4 | Active |
| US8281674B2 | Wafer inspection system and a method for translating wafers [PD] | Physics | 3 | Active |
| US9754812B2 | Adaptable end effector | Electricity | 2 | Active |
| US7570799B2 | Morphological inspection method based on skeletonization | Physics | 2 | Expired |
| US8731274B2 | Method and system for wafer registration | Physics | 2 | Active |
| US8699784B2 | Inspection recipe generation and inspection based on an inspection recipe | Physics | 2 | Active |
| US11828713B1 | Semiconductor inspection tool system and method for wafer edge inspection | Electricity | 2 | Active |
| US8238645B2 | Inspection system and a method for detecting defects based upon a reference frame | Electricity | 2 | Active |
| US10222517B2 | Aperture stop | Physics | 2 | Active |
| US8514385B2 | Device and method for inspecting an object | Physics | 2 | Active |
| US8666532B2 | Method and system for controlling a manufacturing process | Electricity | 1 | Active |
| US10497092B2 | Continuous light inspection | Electricity | 1 | Active |
| US8243262B2 | Method and system for supporting a moving optical component on a sloped portion | Physics | 1 | Active |
| US9147102B2 | Method and system for measuring bumps based on phase and amplitude information | Physics | 1 | Active |
| US8363229B2 | System and method for height triangulation measurement | Physics | 1 | Active |
| US8233699B2 | Inspection system and a method for detecting defects based upon a reference frame | Electricity | 1 | Active |
| US11047807B2 | Defect detection | Physics | 1 | Active |
| US8565508B2 | System and a method for insepcting an object using a hybrid sensor | Physics | 1 | Active |
Source: USPTO / EPO open patent data. Counts and citation impact are objective bibliographic measures.