Three-dimensional measuring instrument
US8578618B2 · kind B2 · utility
2Cited by
8References
1Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 11, 2011 |
| Grant date | Nov 12, 2013 |
| Priority date | — |
| Expiry date | Jan 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
According to the present invention, a three-dimensional measuring instrument includes a spindle that moves an object to be controlled in a predetermined axis direction; and a controlling device that controls a position of the object to be controlled by controlling a position of the spindle. The three-dimensional measuring instrument further includes an absolute-type linear encoder that outputs an absolute position of the spindle. With this, it is possible to start measurement by the three-dimensional measuring instrument in a short period of time.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.