Patent · US Active

Integrated debugging within an integrated circuit having an embedded processor

US8595561B1 · kind B1 · utility

12Cited by

8References

16Claims

0Family size

Assignee

XILINX, INC. · US

Inventors

Ting Lu · Austin, US
Robert Landon Pelt · Austin, US
Bradley L. Taylor · Santa Cruz, US

Key dates

Filing date	Oct 27, 2010
Grant date	Nov 26, 2013
Priority date	—
Expiry date	Nov 7, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/31705
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of debugging within an integrated circuit (IC) that includes an embedded processor can include detecting an event within a circuit of the IC that is external to the processor and, responsive to detecting the event, initiating a debug function within the processor. Similarly, responsive to detecting an event within the processor, a debug function within a circuit block of the IC that is external to the processor can be initiated. Trace data generated within the processor and trace data generated within the programmable fabric further can be merged to generate combined trace data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.