Patent · US Active

Automatic analyzer

US8600689B2 · kind B2 · utility

2Cited by

15References

6Claims

0Family size

Assignee

Hitachi High-Technologies Corporation · JP

Inventors

Toshihide Orihashi · Tokyo, JP
Yoshimitsu Takagi · Hitachinaka, JP
Mikio Kasama · Mito, JP

Key dates

Filing date	Sep 11, 2006
Grant date	Dec 3, 2013
Priority date	—
Expiry date	Apr 18, 2027

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T436/11
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An automatic analyzer includes a function in which the measured data of a quality control sample is compared with reference maximum and minimum values of measured data of the quality control sample. When the measured data is out of the range between the reference maximum and minimum values, re-measurement for calibration is recommended to a user who can easily confirm the recommendation on an operation screen and request the re-measurement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.