Cantilever for scanning probe microscope and scanning probe microscope equipped with it
US8601608B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Mar 30, 2006 |
| Grant date | Dec 3, 2013 |
| Priority date | — |
| Expiry date | Nov 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/60
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microscope including both an atomic force microscope and a near-field optical microscope and capable of performing electrochemical measurements and a cantilever for the microscope are disclosed. A pointed light transmitting material employed as the probe of an atomic force microscope is coated with a metal layer; the metal layer is further coated with an insulating layer; the insulating layer is removed only at the distal end to expose the metal layer; the slightly exposed metal layer is employed as a working electrode; and the probe can be employed not only as the probe of the atomic force microscope and the near-field optical microscope but also as the electrode of an electrochemical microscope. Consequently, the microscope can have the functions of an atomic force microscope, a near-field optical microscope and an electrochemical microscope.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.