Operational system test method
US8607094B2 · kind B2 · utility
0Cited by
16References
13Claims
0Family size
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Key dates
| Filing date | Jul 19, 2010 |
| Grant date | Dec 10, 2013 |
| Priority date | — |
| Expiry date | Jun 24, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3668
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention features an operational system test method, comprising defining a fault model, inserting a test agent, hooking a test location, collecting test information, and removing the test agent. The invention also features an operational system test method, comprising defining a fault model, inserting a test agent, identifying a memory area according to a test location, hooking the identified memory area, collecting test information, and removing the test agent.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.