Hae Young Kwon
6Patents
1h-index
13Co-inventors
40Inventor score
Filing activity: Jul 18, 2008 → Nov 1, 2013
Most-cited inventions
| Patent | Title | Area | Cited by | Status |
|---|---|---|---|---|
| US7962795B2 | Embedded system and method of recovering flash memory | Physics | 2 | Active |
| US9354996B2 | System test apparatus | Physics | 1 | Active |
| US8607094B2 | Operational system test method | Physics | 0 | Active |
| US9176830B2 | Method for determining software error in virtualization based integrated control system | Physics | 0 | Active |
| US9047401B2 | Exception handling test apparatus and method | Physics | 0 | Active |
| US9009532B2 | Communication test apparatus and method | Physics | 0 | Active |
Source: USPTO / EPO open patent data. Inventor disambiguation is heuristic; counts are objective bibliographic measures.