High frequency deflection measurement of IR absorption
US8607622B2 · kind B2 · utility
15Cited by
1References
6Claims
0Family size
Assignee
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Key dates
| Filing date | Jul 18, 2011 |
| Grant date | Dec 17, 2013 |
| Priority date | — |
| Expiry date | Jul 18, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/3563
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An AFM based technique has been demonstrated for performing highly localized IR spectroscopy on a sample surface. Such a technique implemented in a commercially viable analytical instrument would be extremely useful. Various aspects of the experimental set-up have to be changed to create a commercial version. The invention addresses many of these issues thereby producing a version of the analytical technique that can be made generally available to the scientific community.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.