Patent · US Active

Particle sticking prevention apparatus and plasma processing apparatus

US8608422B2 · kind B2 · utility

6Cited by
9References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 7, 2004
Grant dateDec 17, 2013
Priority date
Expiry dateMay 6, 2029

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J2237/0048
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

In order to prevent particles within a unit from sticking to a substrate in a substrate processing process, an ion generator charges the particles. At the same time, a direct current voltage of the same polarity as the charged polarity of the particles is applied from a direct current power source to the substrate. In order to prevent generation of particles when producing gas plasma, a high-frequency voltage is applied to the upper and lower electrodes at multiple stages to produce plasma. In other words, at a first step, a minimum high-frequency voltage at which plasma can be ignited is applied to the upper and lower electrodes, thereby producing a minimum plasma. Thereafter, the applied voltage is increased in stages to produce predetermined plasma.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.